![]({"xsmall":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/scattercontrol_icon_1_imagequality.svg/_jcr_content/renditions/original./scattercontrol_icon_1_imagequality.svg","small":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/scattercontrol_icon_1_imagequality.svg/_jcr_content/renditions/original./scattercontrol_icon_1_imagequality.svg","medium":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/scattercontrol_icon_1_imagequality.svg/_jcr_content/renditions/original./scattercontrol_icon_1_imagequality.svg","large":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/scattercontrol_icon_1_imagequality.svg/_jcr_content/renditions/original./scattercontrol_icon_1_imagequality.svg","xlarge":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/scattercontrol_icon_1_imagequality.svg/_jcr_content/renditions/original./scattercontrol_icon_1_imagequality.svg","xxlarge":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/scattercontrol_icon_1_imagequality.svg/_jcr_content/renditions/original./scattercontrol_icon_1_imagequality.svg","max":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/scattercontrol_icon_1_imagequality.svg/_jcr_content/renditions/original./scattercontrol_icon_1_imagequality.svg"}){kind=icon}
![]({"xsmall":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/scattercontrol_icon_2_surfacedetection.svg/_jcr_content/renditions/original./scattercontrol_icon_2_surfacedetection.svg","small":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/scattercontrol_icon_2_surfacedetection.svg/_jcr_content/renditions/original./scattercontrol_icon_2_surfacedetection.svg","medium":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/scattercontrol_icon_2_surfacedetection.svg/_jcr_content/renditions/original./scattercontrol_icon_2_surfacedetection.svg","large":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/scattercontrol_icon_2_surfacedetection.svg/_jcr_content/renditions/original./scattercontrol_icon_2_surfacedetection.svg","xlarge":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/scattercontrol_icon_2_surfacedetection.svg/_jcr_content/renditions/original./scattercontrol_icon_2_surfacedetection.svg","xxlarge":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/scattercontrol_icon_2_surfacedetection.svg/_jcr_content/renditions/original./scattercontrol_icon_2_surfacedetection.svg","max":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/scattercontrol_icon_2_surfacedetection.svg/_jcr_content/renditions/original./scattercontrol_icon_2_surfacedetection.svg"}){kind=icon}
![]({"xsmall":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/scattercontrol_icon_3_fastscanning.svg/_jcr_content/renditions/original./scattercontrol_icon_3_fastscanning.svg","small":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/scattercontrol_icon_3_fastscanning.svg/_jcr_content/renditions/original./scattercontrol_icon_3_fastscanning.svg","medium":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/scattercontrol_icon_3_fastscanning.svg/_jcr_content/renditions/original./scattercontrol_icon_3_fastscanning.svg","large":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/scattercontrol_icon_3_fastscanning.svg/_jcr_content/renditions/original./scattercontrol_icon_3_fastscanning.svg","xlarge":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/scattercontrol_icon_3_fastscanning.svg/_jcr_content/renditions/original./scattercontrol_icon_3_fastscanning.svg","xxlarge":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/scattercontrol_icon_3_fastscanning.svg/_jcr_content/renditions/original./scattercontrol_icon_3_fastscanning.svg","max":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/scattercontrol_icon_3_fastscanning.svg/_jcr_content/renditions/original./scattercontrol_icon_3_fastscanning.svg"}){kind=icon}
![]({"xsmall":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/scattercontrol_icon_4_easytouse.svg/_jcr_content/renditions/original./scattercontrol_icon_4_easytouse.svg","small":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/scattercontrol_icon_4_easytouse.svg/_jcr_content/renditions/original./scattercontrol_icon_4_easytouse.svg","medium":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/scattercontrol_icon_4_easytouse.svg/_jcr_content/renditions/original./scattercontrol_icon_4_easytouse.svg","large":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/scattercontrol_icon_4_easytouse.svg/_jcr_content/renditions/original./scattercontrol_icon_4_easytouse.svg","xlarge":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/scattercontrol_icon_4_easytouse.svg/_jcr_content/renditions/original./scattercontrol_icon_4_easytouse.svg","xxlarge":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/scattercontrol_icon_4_easytouse.svg/_jcr_content/renditions/original./scattercontrol_icon_4_easytouse.svg","max":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/scattercontrol_icon_4_easytouse.svg/_jcr_content/renditions/original./scattercontrol_icon_4_easytouse.svg"}){kind=icon}
![]({"xsmall":"https://www.zeiss.fi/content/dam/iqs/r/software/automated-defect-detection/zeiss_software_zadd_header_2.jpg/_jcr_content/renditions/original.image_file.100.50.0,60,1920,1020.file/zeiss_software_zadd_header_2.jpg","small":"https://www.zeiss.fi/content/dam/iqs/r/software/automated-defect-detection/zeiss_software_zadd_header_2.jpg/_jcr_content/renditions/original.image_file.360.180.0,60,1920,1020.file/zeiss_software_zadd_header_2.jpg","medium":"https://www.zeiss.fi/content/dam/iqs/r/software/automated-defect-detection/zeiss_software_zadd_header_2.jpg/_jcr_content/renditions/original.image_file.768.384.0,60,1920,1020.file/zeiss_software_zadd_header_2.jpg","large":"https://www.zeiss.fi/content/dam/iqs/r/software/automated-defect-detection/zeiss_software_zadd_header_2.jpg/_jcr_content/renditions/original.image_file.1024.512.0,60,1920,1020.file/zeiss_software_zadd_header_2.jpg","xlarge":"https://www.zeiss.fi/content/dam/iqs/r/software/automated-defect-detection/zeiss_software_zadd_header_2.jpg/_jcr_content/renditions/original.image_file.1280.640.0,60,1920,1020.file/zeiss_software_zadd_header_2.jpg","xxlarge":"https://www.zeiss.fi/content/dam/iqs/r/software/automated-defect-detection/zeiss_software_zadd_header_2.jpg/_jcr_content/renditions/original.image_file.1440.720.0,60,1920,1020.file/zeiss_software_zadd_header_2.jpg","max":"https://www.zeiss.fi/content/dam/iqs/r/software/automated-defect-detection/zeiss_software_zadd_header_2.jpg/_jcr_content/renditions/original.image_file.1920.960.0,60,1920,1020.file/zeiss_software_zadd_header_2.jpg"})
![]({"xsmall":"https://www.zeiss.fi/content/dam/iqs/r/software/automated-defect-detection/zeiss_software_zadd_header_1000x1000.jpg/_jcr_content/renditions/original.image_file.100.100.file/zeiss_software_zadd_header_1000x1000.jpg","small":"https://www.zeiss.fi/content/dam/iqs/r/software/automated-defect-detection/zeiss_software_zadd_header_1000x1000.jpg/_jcr_content/renditions/original.image_file.360.360.file/zeiss_software_zadd_header_1000x1000.jpg","medium":"https://www.zeiss.fi/content/dam/iqs/r/software/automated-defect-detection/zeiss_software_zadd_header_1000x1000.jpg/_jcr_content/renditions/original.image_file.768.768.file/zeiss_software_zadd_header_1000x1000.jpg","large":"https://www.zeiss.fi/content/dam/iqs/r/software/automated-defect-detection/zeiss_software_zadd_header_1000x1000.jpg/_jcr_content/renditions/original./zeiss_software_zadd_header_1000x1000.jpg","xlarge":"https://www.zeiss.fi/content/dam/iqs/r/software/automated-defect-detection/zeiss_software_zadd_header_1000x1000.jpg/_jcr_content/renditions/original./zeiss_software_zadd_header_1000x1000.jpg","xxlarge":"https://www.zeiss.fi/content/dam/iqs/r/software/automated-defect-detection/zeiss_software_zadd_header_1000x1000.jpg/_jcr_content/renditions/original./zeiss_software_zadd_header_1000x1000.jpg","max":"https://www.zeiss.fi/content/dam/iqs/r/software/automated-defect-detection/zeiss_software_zadd_header_1000x1000.jpg/_jcr_content/renditions/original./zeiss_software_zadd_header_1000x1000.jpg"})
Luotettava arviointiohjelmisto röntgentarkastusta varten
ZEISS Automated Defect Detection (ZADD) ‑ohjelmisto havaitsee luotettavasti pienimmätkin viat muun muassa ruiskuvaletuista, lääketieteellisistä ja additiivisesti valmistetuista komponenteista.
![]({"xsmall":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/zeiss_scattercontrol_header_high-res.jpg/_jcr_content/renditions/original.image_file.100.33.748,0,3625,960.file/zeiss_scattercontrol_header_high-res.jpg","small":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/zeiss_scattercontrol_header_high-res.jpg/_jcr_content/renditions/original.image_file.360.120.748,0,3625,960.file/zeiss_scattercontrol_header_high-res.jpg","medium":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/zeiss_scattercontrol_header_high-res.jpg/_jcr_content/renditions/original.image_file.768.256.748,0,3625,960.file/zeiss_scattercontrol_header_high-res.jpg","large":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/zeiss_scattercontrol_header_high-res.jpg/_jcr_content/renditions/original.image_file.1024.341.748,0,3625,960.file/zeiss_scattercontrol_header_high-res.jpg","xlarge":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/zeiss_scattercontrol_header_high-res.jpg/_jcr_content/renditions/original.image_file.1280.427.748,0,3625,960.file/zeiss_scattercontrol_header_high-res.jpg","xxlarge":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/zeiss_scattercontrol_header_high-res.jpg/_jcr_content/renditions/original.image_file.1440.480.748,0,3625,960.file/zeiss_scattercontrol_header_high-res.jpg","max":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/zeiss_scattercontrol_header_high-res.jpg/_jcr_content/renditions/original.image_file.1920.640.748,0,3625,960.file/zeiss_scattercontrol_header_high-res.jpg"})
ZEISS scatterControl
Poikkeuksellinen CT-kuvien laatu
Laitteistoratkaisu optimoitua kuvanlaatua varten
ZEISS scatterControl ‑moduuli parantaa merkittävästi CT-kuvien laatua ja vähentää artefaktit minimiin. Nämä parannukset helpottavat soveltuvien osien myöhempää tietojenkäsittelyä ja arviointivaiheita, mikä johtaa entistä tarkempaan pinnan määritykseen ja vika-analyysiin. Tuote sopii erinomaisesti suurille ja tiheille osille, kuten jopa teräsvahvikkeisille additiivisesti valmistetuille metalliosille ja alumiinivaluosille, sekä muille tiheämmistä materiaaleista valmistetuille kokoonpanoille.
Moduuli on saatavilla ZEISS METROTOM 1500 225 kV G3 ‑järjestelmään joko jälkiasennusratkaisuna tai osana uuden järjestelmän hankintaa. Päivitä järjestelmääsi ZEISS scatterControl ‑moduuli jo tänään, jotta voit hyötyä ensiluokkaisesta kuvanlaadusta paljon helpompaa tietojen arviointia varten.
ZEISS scatterControl parempaan vikojen analysointiin
ZEISS scatterControl parantaa merkittävästi mitä erilaisimpien osien CT-kuvien laatua eri teollisuuden aloilla. Tehokas artefaktien poisto, moduulin sijoittelu suhteessa työkappaleeseen ja muut selvää parannusta tuovat tekijät tekevät ZEISS scatterControl ‑moduulista ihanteellisen valinnan. Lue alta, miten moduulia voidaan käyttää ensiluokkaiseen vikojen havaitsemiseen ja analysointiin.
![]({"xsmall":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/reduced_artefacts_high_res.jpg/_jcr_content/renditions/original.image_file.100.56.file/reduced_artefacts_high_res.jpg","small":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/reduced_artefacts_high_res.jpg/_jcr_content/renditions/original.image_file.360.203.file/reduced_artefacts_high_res.jpg","medium":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/reduced_artefacts_high_res.jpg/_jcr_content/renditions/original.image_file.768.432.file/reduced_artefacts_high_res.jpg","large":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/reduced_artefacts_high_res.jpg/_jcr_content/renditions/original.image_file.1024.576.file/reduced_artefacts_high_res.jpg","xlarge":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/reduced_artefacts_high_res.jpg/_jcr_content/renditions/original.image_file.1280.720.file/reduced_artefacts_high_res.jpg","xxlarge":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/reduced_artefacts_high_res.jpg/_jcr_content/renditions/original.image_file.1440.810.file/reduced_artefacts_high_res.jpg","max":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/reduced_artefacts_high_res.jpg/_jcr_content/renditions/original.image_file.1920.1080.file/reduced_artefacts_high_res.jpg"})
![]({"xsmall":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/reduced_artefacts_2_high_res.jpg/_jcr_content/renditions/original.image_file.100.56.file/reduced_artefacts_2_high_res.jpg","small":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/reduced_artefacts_2_high_res.jpg/_jcr_content/renditions/original.image_file.360.203.file/reduced_artefacts_2_high_res.jpg","medium":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/reduced_artefacts_2_high_res.jpg/_jcr_content/renditions/original.image_file.768.432.file/reduced_artefacts_2_high_res.jpg","large":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/reduced_artefacts_2_high_res.jpg/_jcr_content/renditions/original.image_file.1024.576.file/reduced_artefacts_2_high_res.jpg","xlarge":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/reduced_artefacts_2_high_res.jpg/_jcr_content/renditions/original.image_file.1280.720.file/reduced_artefacts_2_high_res.jpg","xxlarge":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/reduced_artefacts_2_high_res.jpg/_jcr_content/renditions/original.image_file.1440.810.file/reduced_artefacts_2_high_res.jpg","max":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/reduced_artefacts_2_high_res.jpg/_jcr_content/renditions/original.image_file.1920.1080.file/reduced_artefacts_2_high_res.jpg"})
Vähemmän artefakteja parempaa CT-kuvien laatua varten
ZEISS scatterControl tekee selvän eron. Vertaa scatterControl-moduulilla parannettua röntgenkuvan laatua parantamattomaan kuvaan vetämällä liukusäädintä. Parannellussa kuvassa on suurempi kontrasti ja vähemmän artefakteja, joten yksityiskohdat erottuvat paljon selvemmin.
![]({"xsmall":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/scattercontrol_metrotom_inside_high_res.png/_jcr_content/renditions/original.image_file.100.56.37,0,1498,822.file/scattercontrol_metrotom_inside_high_res.png","small":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/scattercontrol_metrotom_inside_high_res.png/_jcr_content/renditions/original.image_file.360.203.37,0,1498,822.file/scattercontrol_metrotom_inside_high_res.png","medium":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/scattercontrol_metrotom_inside_high_res.png/_jcr_content/renditions/original.image_file.768.432.37,0,1498,822.file/scattercontrol_metrotom_inside_high_res.png","large":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/scattercontrol_metrotom_inside_high_res.png/_jcr_content/renditions/original.image_file.1024.576.37,0,1498,822.file/scattercontrol_metrotom_inside_high_res.png","xlarge":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/scattercontrol_metrotom_inside_high_res.png/_jcr_content/renditions/original.image_file.1280.720.37,0,1498,822.file/scattercontrol_metrotom_inside_high_res.png","xxlarge":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/scattercontrol_metrotom_inside_high_res.png/_jcr_content/renditions/original.image_file.1440.810.37,0,1498,822.file/scattercontrol_metrotom_inside_high_res.png","max":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/scattercontrol_metrotom_inside_high_res.png/_jcr_content/renditions/original.image_file.1461.822.37,0,1498,822.file/scattercontrol_metrotom_inside_high_res.png"})
Ylivoimainen laatu moduulin sijoittelun ansiosta
ZEISS scatterControl toimii moduuliperiaatteella, minkä ansiosta se tarjoaa ylivoimaisen laadun samankaltaisiin tuotteisiin verrattuna: Se sijoitetaan putken ja ilmaisimen väliin. Pienemmät esineet, kuten tiheät additiivisesti valmistetut osat, voidaan sijoittaa moduulin eteen ja suuremmat osat sen taakse. Molemmat tavat toimivat moitteettomasti. Lisäksi sisäinen fyysinen törmäysanturi ja kehittynyt törmäysten ennusteohjelmisto ehkäisevät tehokkaasti yhteentörmäyksiä.
Sopii erilaisille osille ja teollisuudenaloille
- Valimot: Massiiviset alumiini- tai magnesiumosat ja jopa teräsvahvikkeiset osat
- Autoteollisuus: Teräsvahvikkeiset valukappaleet, tehoelektroniikka
- Additiivinen valmistus: Tiheät, metallitulostetut osat
![]({"xsmall":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/scattercontrol_gutter_with_high_res.jpg/_jcr_content/renditions/original.image_file.100.56.1,0,1526,858.file/scattercontrol_gutter_with_high_res.jpg","small":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/scattercontrol_gutter_with_high_res.jpg/_jcr_content/renditions/original.image_file.360.203.1,0,1526,858.file/scattercontrol_gutter_with_high_res.jpg","medium":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/scattercontrol_gutter_with_high_res.jpg/_jcr_content/renditions/original.image_file.768.432.1,0,1526,858.file/scattercontrol_gutter_with_high_res.jpg","large":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/scattercontrol_gutter_with_high_res.jpg/_jcr_content/renditions/original.image_file.1024.576.1,0,1526,858.file/scattercontrol_gutter_with_high_res.jpg","xlarge":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/scattercontrol_gutter_with_high_res.jpg/_jcr_content/renditions/original.image_file.1280.720.1,0,1526,858.file/scattercontrol_gutter_with_high_res.jpg","xxlarge":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/scattercontrol_gutter_with_high_res.jpg/_jcr_content/renditions/original.image_file.1440.810.1,0,1526,858.file/scattercontrol_gutter_with_high_res.jpg","max":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/scattercontrol_gutter_with_high_res.jpg/_jcr_content/renditions/original.image_file.1525.858.1,0,1526,858.file/scattercontrol_gutter_with_high_res.jpg"})
![]({"xsmall":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/scattercontrol_gutter_without_high_res.jpg/_jcr_content/renditions/original.image_file.100.56.1,0,1526,858.file/scattercontrol_gutter_without_high_res.jpg","small":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/scattercontrol_gutter_without_high_res.jpg/_jcr_content/renditions/original.image_file.360.203.1,0,1526,858.file/scattercontrol_gutter_without_high_res.jpg","medium":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/scattercontrol_gutter_without_high_res.jpg/_jcr_content/renditions/original.image_file.768.432.1,0,1526,858.file/scattercontrol_gutter_without_high_res.jpg","large":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/scattercontrol_gutter_without_high_res.jpg/_jcr_content/renditions/original.image_file.1024.576.1,0,1526,858.file/scattercontrol_gutter_without_high_res.jpg","xlarge":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/scattercontrol_gutter_without_high_res.jpg/_jcr_content/renditions/original.image_file.1280.720.1,0,1526,858.file/scattercontrol_gutter_without_high_res.jpg","xxlarge":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/scattercontrol_gutter_without_high_res.jpg/_jcr_content/renditions/original.image_file.1440.810.1,0,1526,858.file/scattercontrol_gutter_without_high_res.jpg","max":"https://www.zeiss.fi/content/dam/iqs/r/systems/x-ray/scattercontrol/scattercontrol_gutter_without_high_res.jpg/_jcr_content/renditions/original.image_file.1525.858.1,0,1526,858.file/scattercontrol_gutter_without_high_res.jpg"})
Parempi 3D-tarkastus
Tilavuustietoihin kohdistuvat parannukset helpottavat huomattavasti arviointia. 3D-pinnat voidaan määrittää ja renderöidä ilman häiritseviä artefakteja. Monet artefaktit ovat tyypillisesti seurausta sironneesta säteilystä ja aiheuttavat 3D:ssä näennäispintoja, jotka estävät tarkat mittaukset.
Usein kysytyt kysymykset ZEISS scatterControl ‑moduulista
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Eniten ZEISS scatterControl ‑moduulista hyötyvät massiiviset alumiini- tai magnesiumosat, teräsvahvikkeiset valukappaleet, tehoelektroniikka sekä tiheät ja metallitulostetut osat – nämä ovat vain muutamia esimerkkejä.
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ZEISS scatterControl on yhden klikkauksen ratkaisu. Ohjelmiston ja laitteiston törmäyssuojaukset on jo integroitu, joten voit aloittaa skannausprosessin ilman ylimääräisiä vaiheita.
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Kyllä, ZEISS scatterControl on ihanteellinen jälkiasennusratkaisu ZEISS METROTOM 1500 G3 ‑koneeseen. Saatat tarvita esimerkiksi METROTOM OS ‑ohjelmistopäivityksen, jotta CT-järjestelmääsi voidaan laajentaa scatterControl-moduulilla.